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  • Oxygen-free copper with grain growth suppression

    MOFC™-GC

    C10810

    • Thermal management
    PDF download View Brand

    Main applications

    Insulation substrate (AMB substrate)

    • plate
    • strip
    • bar
    • wire
    • ball

    MOFC-GC is an oxygen-free copper with world-class crystal grain growth inhibition performance, contributing to improved quality and enhanced process stability in a wide range of electronic components and power modules.

    Positioning map

    While maintaining electrical and thermal conductivity comparable to conventional oxygen-free copper (C10200), MOFC-GC suppresses crystal grain growth at elevated temperatures and achieves a fine and uniform crystal structure even after high-temperature processing.

    Insulation substrate (AMB substrate)

    Main features

    1. MOFC-GC offers electrical and thermal conductivity comparable to that of conventional oxygen-free copper.
    2. MOFC-GC suppresses crystal grain growth at high temperatures and maintains a fine and uniform crystal structure even after heat treatment at 1000℃.

    Benefits of MOFC-GC

    The following benefits can be expected from using MOFC-GC as the material for ceramic substrates such as AMB substrates.

    • Improved optical recognizability
    • Reduced surface roughness (improved smoothness and reduced variation)
    • Improved plating appearance
    • Improved ultrasonic image inspection quality of the brazing boundary between the copper circuit layer and the ceramic
    • Stabilized substrate warpage
    • Improved thermal cycle reliability
    • Resolves the problem of insufficient wire bonding strength (when using small diameter wires, etc.)
    • Reduced variation in semiconductor device soldering and sintered material bonding

    Chemical composition

    (Weight %)

    Cu
    99.95% Min.
    * Including inevitable impurities and trace additive elements.
    Technical Data

    Physical properties

    (Weight %)

    Property Representative
    Value​
    Specific Gravity 8.94
    Coefficient of Thermal Expansion
    ×10-6/K(293~573℃)
    17.6
    Thermal Conductivity
    (W/(m・K):293K)
    391
    Volume Resistivity
    (μΩm:293K)
    0.017
    Electrical Conductivity
    (%IACS:293K)
    101
    Modulus of Elasticity
    kN/mm²
    119
    Poisson’s Ratio
    (293K)
    0.30

    Mechanical properties

      Temper Typical Values
    1/4H 1/4H
    t:0.8mm
    Tensile Strength
    (N/mm²)
    215-275 245
    Elongation
    (%)
    25 Min. 36
    Vickers Hardness
    (HV)
    - 71

    Grain growth suppression capability

    It has been confirmed that MOFC-GC suppresses crystal grain growth even during heat treatment at 1000℃. With its superior crystal grain growth inhibition performance, MOFC-GC maintains a fine and uniform crystal structure even after AMB (Active Metal Bonding).

    Grain size after heat treatment in air atmosphere
    Heating rate: 10℃/min
    Hold time: 1h

    Microstructure after heat treatment in air atmosphere
    Heating rate: 10℃/min
    Hold time: 1h

    Microstructure of our company prototype AMB substrate

Leaflet download

MOFC-GCPDF ALLOY GUIDE(Plate/Strip)PDF